International Low Voltage Symposium Boston 2012
YY1: Low Voltage EM Fundamentals and Applications
Chair: Lawrence Drummy
YY1.01 Raymond F. Egerton
Physics, University of Alberta, Edmonton, AB, Canada
Advantages and Disadvantages of Low-voltage TEM for the Imaging and Spectroscopy of Organic and Inorganic Materials
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YY1.02 Nabil D. Bassim et al.
Naval Research Laboratory, Washington, DC, USA
STEM Imaging of Unstained DNA Nanostructures Using Suspended Graphene at High and Low Voltages
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YY1.03 Tatiana Latychevskaia et al.
Physics Institute, Zurich, Switzerland
Low-energy Electron Holograms and Diffraction Patterns of Individual Biomolecules
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YY1.04 Christian F. Kisielowski et al.
Joint Center for Artificial Photosynthesis and National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA, USA
Applications of Atomic-resolution, Low Dose-rate Electron Microscopy with Variable Voltage
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YY1.05 Aiden A. Martin et al.
School of Physics and Advanced Materials, University of Technology, Sydney, Broadway, NSW, Australia
Damage Generation in Ultra Nano-crystalline Diamond by Low-energy Electron Irradiation.
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YY1.06 David C. Martin and Jinglin Liu
Materials Science and Engineering, The University of Delaware, Newark, DE, USA
Low Dose and Low Voltage Electron Microscopy of Defects in Polymer and Organic Molecular Materials
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YY1.07 Felix Deschler et al.
Physics, Ludwig-Maximilians-University, Munich, Germany
Low-voltage Scanning Electron Microscopy Imaging of Doped Organic Semiconductors Films
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YY1.08 Ute Golla-Schindler et al.
Group of Electron Microscopy of Materials Science, University of Ulm, Ulm, Germany
Low Voltage Transmission Electron Microscopy to Study Quantitative Electron-irradiation Damage by in situ Investigation of the Phase Transformation from Calcite to Lime
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YY2: Advances in Instrumentation and Methods
Chair: Lawrence Drummy
YY2.01 Harald H. Rose and Ute A. Kaiser
Group of Electron Microscopy of Materials Science, University of Ulm, Ulm, Germany
Conditions, Prospects and First Results of High-resolution Low-voltage Electron Microscopy - The SALVE Project
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YY2.02 Max. Haider et al.
CEOS GmbH, Heidelberg, Germany
Correction of Spherical and Chromatic Aberration for a Dedicated Low Voltage TEM
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YY2.03 Osamu Kamimura et al.
Central Research Laboratory, Hitachi, Ltd., Kokubunji-shi, Japan
Low-voltage Electron-diffraction Microscopy Using SEM-based Microscope
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YY2.04 Marian Mankos et. al.
Electron Optica, Palo Alto, CA, USA
An Aberration-corrected Low Energy Electron Microscope for DNA Sequencing and Surface Analysis
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YY2.05 Jean-Nicolas Longchamp et al.
Physics Institute, Zurich, Switzerland
An Coherent Low-energy (below 250eV) Electron Diffractive Imaging of Freestanding Graphene
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YY2.06 Benedikt Westenfelder et al.
Institute of Optoelectronics, Ulm University, Ulm, Germany
In-situ HRTEM Electrical Investigations on Graphene.
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YY2.07 Lothar Houben et al.
Peter Gruenberg Institut and Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Research Center Juelich GmbH, Juelich, Germany
Chromatic Aberration-corrected Energy-filtered Transmission Electron Microscopy on the Atomic Scale
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YY3: Poster Session: Low Voltage Electron Microscopy and Spectroscopy for Materials Characterization
YY3.01 Ute Golla-Schindler et. al.
Group of Electron Microscopy of Materials Science, University of Ulm, Ulm, Germany
An Aberration-corrected Low Energy Electron Microscope for DNA Sequencing and Surface Analysis
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YY3.02 Simon Kurasch et al.
Central Facility for Electron Microscopy, University of Ulm, Ulm, Germany
Atom-by-atom Observation of Grain Boundary Migration in Graphene
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YY3.03 Thilo Zoberbier et al.
Electron Microscopy of Materials Science, Ulm University, Ulm, Germany
In-situ Aberration-corrected HRTEM Studies of the Dynamics of Me@SWNT as a Function of Electron Dose and Low Electron Beam Energies between 20 and 80 keV
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YY3.04 Jinglin Liu and David C. Martin
Materials Science and Engineering, University of Delaware, Newark, DE, USA
Ultrathin Substrates for the Low-Voltage Electron Microscopy (LVEM) of Organic Materials
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YY3.05 Kenji Umezawa
Dept. of Physics, Osaka Prefecture University, Sakai, Japan
Low Energy Atom Scattering Spectroscopy for Insulator Surface Analysis: MgO(111) Surfaces
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YY4: Electron-sample Interactions and Spectroscopic Imaging
Chair: Ute Kaiser
YY4.01 Matthew Libera
Stevens Institute of Technology, Hoboken, NJ, USA
Low Voltage Electron Microscopy Applied to Core Shell CdSe/CdZnS QDs
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YY4.02 Jihua Chen et al.
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Analytical Transmission Electron Microscopy for Soft Materials and Organic Crystals at the Center for Nanophase Materials Sciences.
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YY4.03 Philipp Wachsmuth et. al.
Electron Microscopy Group of Materials Science, Ulm University, Ulm, Germany
Momentum Dependent Electron Energy-loss in Graphene and MoS2 Investigated at 20 and 40kV
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YY4.04 Ondrej L. Krivanek
Nion Co., Kirkland, WA, USA
Single Atom Imaging and Spectroscopy in a Low-kV STEM
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YY4.05 Wu Zhou et al.
Physics and Astronomy, Vanderbilt University, Oak Ridge, TN, USA
Probing Graphene Defect Structures and Local Properties at the Atomic Scale with Gentle STEM
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YY4.06 Kazu Suenaga
AIST, Tsukuba, Japan
Low-voltage STEM-EELS with Atomic Sensitivity
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YY4.07 Hector A. Calderon et al.
Departamento de Fisica, ESFM-IPN, Mexico DF, Mexico
Imaging of CdSe-ZnSe Quantum Wells as a Function of Electron Dose and Accelerating Voltage
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YY4.08 Lluis Yedra et al.
Laboratory of Electron Nanoscopies (LENS)- MIND/IN2UB, Department of Electronics, University of Barcelona, Barcelona, Spain
Accessing New Dimensions of Nanomaterials: EEL Spectroscopic Tomography
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YY5: Theory, Modeling and Signal Processing
Chair: Jihua Chen
YY5.01 Rasmus R. Schroeder et. al.
CellNetworks, Cryo-EM, University of Heidelberg, Heidelberg, Germany
Coherent Imaging with Inelastically Scattered Electrons: High Resolution Object Contrast for a Sample Thickness Exceeding Several Free Mean Paths
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YY5.02 Zhongbo Lee et al.
Electron Microscopy of Material Science, University of Ulm, Ulm, Germany
Image Calculation for Low-voltage Microscopy Based on Mutual Coherence Approach
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YY5.03 Jian Min Zuo and Ke Ran Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL, USA
Electrons for Single Molecule Diffraction and Imaging
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YY5.04 Marc DeGraef
Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA, USA
Forward Modeling Applied to Serial Section Scanning Electron Microscopy and High Angle Annular Dark Field Tomography
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YY5.05 Eric Lifshin
College of Nanoscale Science and Engineering, University of Albany, Albany, NY, USA
A New Method for Enhancing the Resolution of Low Voltage Scanning Electron Microscope Images.
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YY5.06 Raul E. Cachau
Information Systems Program, Frederick National Laboratory for Cancer Research, Frederick, MD, USA
New Strategies for the Processing of Images and Co-location of Samples in a LVEM5 Instrument
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YY5.07 Lawrence F. Drummy et al.
AFRL/RXAS, Air Force Research Laboratories, WPAFB, OH, USA
Model-based Low Voltage Imaging of Core-shell Hybrid Nanoparticles
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YY6/W6: Joint Session: Low Voltage Electron Microscopy
Chair: John Boeckl/Lawrence Drummy
YY6.01/W6.01 Kaili Jiang et al.
Tsinghua-Foxconn Nanotechology Research Center, Beijing, China
Direct Identification of Metallic and Semiconducting Single-walled Carbon Nanotubes in Scanning Electron Microscope.
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YY6.02/W6.02 Bernhard C. Bayer et al.
University of Cambridge, Cambridge, United Kingdom
The Catalyst Phase during Carbon Nanostructure Growth
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YY6.03/W6.03 Matthieu Picher et al.
CNST, NIST, Gaithersburg, MD, USA
Single-walled Carbon Nanotube Growth Mechanisms Studied by In situ TEM and Ex-situ Raman Measurements
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YY6.04/W6.04 Juan C. Idrobo and Wu Zhou
MSTD, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Revealing Angular Dependence on the Optical Response of Bilayer Graphene by Electron Energy-loss Spectroscopy
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YY6.05/W6.05 Naoual Allali et al.
LCPME, Villers-les-Nancy, France
Effects of Oxidation and Chlorination Steps of HiPco Single-walled Carbon Nanotubes Revealed by XPS, TGA-MS and HR-TEM Studies
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YY6.06/W6.06 Wei L. Wang et al.
Physics, Harvard University, Cambridge, MA, USA
TEM Imaging and Simulations of Nanostructures in Ultra-thin Materials
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