2nd SALVE symposium at Ulm University 2015

Tuesday, February 17th, introduction to the SALVE Symposium 2015

Chair: Ute Kaiser

Peter Hartel CEOS GmbH, Heidelberg, Germany
The long way towards SALVE
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David Bell Harvard School of Engineering and Applied Sciences, Harvard University, USA
How development of aberration correction has enabled low voltage electron microscopy
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Takanori Koshikawa Fundamental Electronics Research Institute, Osaka Electro-Communication University, Japan
High brightness and highly spin-polarized Low Energy Electron Microscopy
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Tuesday, February 17th, session 2

Chair: Christoph Koch

Rafal E. Dunin-Borkowski Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Research Centre Jülich, Germany
Tuneable caustic phenomena in electron wavefields
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Dirk van Dyck Electron Microscopy for Material Science, University of Antwerp, Belgium
Atomic resolution tomography and dynamics of nano-objects
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Ondrei Krivanek Nion Company, Kirkland & Arizona State University, USA
Vibrational spectroscopy in the electron microscope
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Tuesday, February 17th, session 3

Chair: Rafal E. Dunin-Borkowski

Bohumila Lencova Tescan Company & Institute of Physical Engineering, University of Brno, Czech Republic
Electron and ion optics behind TESCAN instruments
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Ai Leen Koh Stanford Nano Shared Facilities, Stanford University, USA
The importance of lower voltages for the application of aberration-corrected TEM to nanomaterials
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Andrey Turchanin Friedrich-Schiller University Jena, Germany
Carbon nanomembranes and graphene from organic monolayers
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Tuesday, February 17th, session 4

Chair: Eva Olsen

Tanja Weil Ulm University, Germany
Biohybrid Nanoparticles for Nanomedicine and Sensing
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Elena Bichoutskaja School of Chemistry, Nottingham University, UK
Computational Transmission Electron Microscopy
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Tatiana Latychevskaia Department of Physics, University of Zurich, Switzerland
Coherent imaging with ultra-low energy electrons
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Andrei N. Khlobystov School of Chemistry, Nottingham University, UK
Chemistry of individual molecules through a lens of transmission electron microscope
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Wednesday, February 18th, session 1

Chair: Dirk van Dyck

Johannes Biskupek Group of Electron Microscopy for Materials Science, Ulm University, Germany
High-resolution TEM Imaging and energy loss spectroscopy at low acceleration voltages
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Kazu Suenaga National Institute of Advanced Industrial Science and Technology, Japan
Single atom spectroscopy by low-voltage STEM
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Angus Kirkland Department of Materials, University of Oxford, UK
Structural studies of defects and defect dynamics in graphene
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Jannik C. Meyer University of Vienna, Austria
Analysis and manipulation of radiation sensitive 2D materials
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Wednesday, February 18th, session 2

Chair: Angus Kirkland

Arkady V. Krasheninnikov Department of Applied Physics, Aalto University, Helsinki, Finland
Inorganic two-dimensional materials under electron irradiation: stability, evolution of the atomic structure, and beam-mediated doping
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Michael Stoeger-Pollach USTEM, Vienna University of Technology, Austria
Low voltage EELS and bessel beams in semiconductor science
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Andreas Kastenmueller Gatan GmbH, Germany
Realizing high performance TEM cameras for the 21st century
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Wednesday, February 18th, session 3

Chair: Harald Rose

Annick Loiseau Laboratoire d‘etude des microstructures, ONERA, Chatillon, France
Spectroscopic properties of BN layers
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Ing-Shouh Hwang Institute of Physics, Academia Sinica Nankang, Taipei, Taiwan
Low-energy electron diffractive imaging based on a single-atom electron source
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Weishi Wan College of Material Science and Engineering, Chongqing University, P.R.China and Lawrence Berkeley National Laboratory, Berkeley, USA
Design for an aberration-corrected, ultrafast spin-polarized LEEM with multiple electron sources
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Eva Olsson Applied Physics, Chalmers University, Sweden
Electron beam enhanced thermal stability of polymer photovoltaic blends
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