2nd SALVE symposium at Ulm University 2015
Tuesday, February 17th, introduction to the SALVE Symposium 2015
Chair: Ute Kaiser
Peter Hartel
CEOS GmbH, Heidelberg, Germany
The long way towards SALVE
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David Bell
Harvard School of Engineering and Applied Sciences, Harvard University, USA
How development of aberration correction has enabled low voltage electron microscopy
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Takanori Koshikawa
Fundamental Electronics Research Institute, Osaka Electro-Communication University, Japan
High brightness and highly spin-polarized Low Energy Electron Microscopy
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Tuesday, February 17th, session 2
Chair: Christoph Koch
Rafal E. Dunin-Borkowski
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Research Centre Jülich, Germany
Tuneable caustic phenomena in electron wavefields
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Dirk van Dyck
Electron Microscopy for Material Science, University of Antwerp, Belgium
Atomic resolution tomography and dynamics of nano-objects
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Ondrei Krivanek
Nion Company, Kirkland & Arizona State University, USA
Vibrational spectroscopy in the electron microscope
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Tuesday, February 17th, session 3
Chair: Rafal E. Dunin-Borkowski
Bohumila Lencova
Tescan Company & Institute of Physical Engineering, University of Brno, Czech Republic
Electron and ion optics behind TESCAN instruments
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Ai Leen Koh
Stanford Nano Shared Facilities, Stanford University, USA
The importance of lower voltages for the application of aberration-corrected TEM to nanomaterials
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Andrey Turchanin
Friedrich-Schiller University Jena, Germany
Carbon nanomembranes and graphene from organic monolayers
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Tuesday, February 17th, session 4
Chair: Eva Olsen
Tanja Weil
Ulm University, Germany
Biohybrid Nanoparticles for Nanomedicine and Sensing
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Elena Bichoutskaja
School of Chemistry, Nottingham University, UK
Computational Transmission Electron Microscopy
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Tatiana Latychevskaia
Department of Physics, University of Zurich, Switzerland
Coherent imaging with ultra-low energy electrons
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Andrei N. Khlobystov
School of Chemistry, Nottingham University, UK
Chemistry of individual molecules through a lens of transmission electron microscope
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Wednesday, February 18th, session 1
Chair: Dirk van Dyck
Johannes Biskupek
Group of Electron Microscopy for Materials Science, Ulm University, Germany
High-resolution TEM Imaging and energy loss spectroscopy at low acceleration voltages
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Kazu Suenaga
National Institute of Advanced Industrial Science and Technology, Japan
Single atom spectroscopy by low-voltage STEM
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Angus Kirkland
Department of Materials, University of Oxford, UK
Structural studies of defects and defect dynamics in graphene
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Jannik C. Meyer
University of Vienna, Austria
Analysis and manipulation of radiation sensitive 2D materials
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Wednesday, February 18th, session 2
Chair: Angus Kirkland
Arkady V. Krasheninnikov
Department of Applied Physics, Aalto University, Helsinki, Finland
Inorganic two-dimensional materials under electron irradiation: stability, evolution of the atomic structure, and beam-mediated doping
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Michael Stoeger-Pollach
USTEM, Vienna University of Technology, Austria
Low voltage EELS and bessel beams in semiconductor science
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Andreas Kastenmueller
Gatan GmbH, Germany
Realizing high performance TEM cameras for the 21st century
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Wednesday, February 18th, session 3
Chair: Harald Rose
Annick Loiseau
Laboratoire d‘etude des microstructures, ONERA, Chatillon, France
Spectroscopic properties of BN layers
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Ing-Shouh Hwang
Institute of Physics, Academia Sinica Nankang, Taipei, Taiwan
Low-energy electron diffractive imaging based on a single-atom electron source
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Weishi Wan
College of Material Science and Engineering, Chongqing University, P.R.China and Lawrence
Berkeley National Laboratory, Berkeley, USA
Design for an aberration-corrected, ultrafast spin-polarized LEEM with multiple electron sources
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Eva Olsson
Applied Physics, Chalmers University, Sweden
Electron beam enhanced thermal stability of polymer photovoltaic blends
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